Description
XVH-330-57MPI-1-10 Экран Eaton
современными требованиями дизайна. Как и XV303, конденсаторный многоточечный сенсорный дисплей поддерживает реализацию
современного пользовательского интерфейса (управление жестами)
и предлагает 7 – и 10 – дюймовые дисплеи, в том числе версии с высоким соотношением сторон 16: 9.
просто и требует меньше компонентов и инженерных работ, чем традиционная проводка. SmartWire – DT интегрирует связь и ввод / вывода
непосредственно в устройства управления, отображения и переключения, открывая новые возможности для инновационных и экономичных решений.
ABB: Запасные части для промышленных роботов серии DSQC, Bailey INFI 90, IGCT, например: 5SHY6545L0001 AC1027001R0101 5SXE10 – 0181, 5SHY3545 L0009, 5SHI3545L0010 3BHB013088 R0001 3BHE009681R0101 GVC750BE101, PM866, PM861K01, PM864, PM510V16, PPD512, PPPD113, PP836A, P865A, 877, PPP881, PPPP885, PPSL500000 4 3BHL00390P0104 5SGY35L4510 и т.д.
General Electric: запасные части, такие как модули, карты и приводы. Например: VMVME – 7807, VMVME – 7750, WES532 – 111, UR6UH, SR469 – P5 – HI – A20, IS230SRTDH2A, IS220PPDAH1B, IS215UCVEH2A, IC698CPE010, IS200SRTDH2ACB и т.д.
Система Bently Nevada: 350 / 3300 / 1900, предохранительные зонды и т.д., например: 3500 / 22M, 3500 / 32, 3500 / 15, 3500 / 23500 / 42M, 1900 / 27 и т.д.
Системы Invis Foxboro: Серия I / A, управление последовательностью FBM, трапециевидное логическое управление, обработка отзыва событий, DAC,
обработка входных / выходных сигналов, передача и обработка данных, такие как FCP270 и FCP280, P0904HA, E69F – TI2 – S, FBM230 / P0926GU, FEM100 / P0973CA и т.д.
Invis Triconex: Модуль питания, модуль CPU, модуль связи, модуль ввода – вывода, например 300830937214351B, 3805E, 831235114355X и т.д.
Вудворд: контроллер местоположения SPC, цифровой контроллер PEAK150, например 8521 – 0312 UG – 10D, 9907 – 149, 9907 – 162, 9907 – 164, 9907 – 167, TG – 13 (8516 – 038), 8440 – 1713 / D, 9907 – 018 2301A, 5466 – 258, 8200 – 226 и т.д.
Hima: модули безопасности, такие как F8650E, F8652X, F8627X, F8678X, F3236, F6217, F6214, Z7138, F8651X, F8650X и т.д.
Honeywell: Все платы DCS, модули, процессоры, такие как: CC – MCAR01, CC – PAIH01, CC – PAIH02, CC – PAIH51, CC – PAIX02, CC – PAON01, CC – PCF901, TC – CR014, TC – PD011, CC – PCNT02 и т.д.
Motorola: серии MVME162, MVME167, MVME172, MVME177, такие как MVME5100, MVME5500 – 0163, VME172PA – 652SE, VME162PA – 344SE – 2G и другие.
Xycom: I / O, платы VME и процессоры, такие как XVME – 530, XVME – 674, XVME – 957, XVME – 976 и т.д.
Коул Морган: Сервоприводы и двигатели, такие как S72402 – NANA, S6201 – 550, S20330 – SRS, CB06551 / PRD – B040SSIB – 63 и т. Д.
Bosch / Luxer / Indramat: модуль ввода / вывода, контроллер PLC, приводной модуль, MSK060C – 0600 – NN – S1 – UP1 – NNN, VT2000 – 52 / R900033828, MHD041B – 144 – PG1 – UN и т.д.
(5) Perform predictive maintenance, analyze machine operating conditions, determine the main
causes of failures, and predict component failures to avoid unplanned downtime.
Traditional quality improvement programs include Six Sigma, Deming Cycle, Total Quality Management (TQM), and Dorian Scheinin’s
Statistical Engineering (SE) [6]. Methods developed in the 1980s and 1990s are typically applied to small amounts
of data and find univariate relationships between participating factors. The use of the MapReduce paradigm to simplify data processing in
large data sets and its further development have led to the mainstream proliferation of big data analytics [7]. Along with the development of
machine learning technology, the development of big data analytics has provided a series of new tools that can be applied to manufacturing
analysis. These capabilities include the ability to analyze gigabytes of data in batch and streaming modes, the ability to find complex multivariate
nonlinear relationships among many variables, and machine learning algorithms that separate causation from correlation.
Millions of parts are produced on production lines, and data on thousands of process and quality measurements are collected for them, which is
important for improving quality and reducing costs. Design of experiments (DoE), which repeatedly explores thousands of causes through
controlled experiments, is often too time-consuming and costly. Manufacturing experts rely on their domain knowledge to detect key
factors that may affect quality and then run
DoEs based on these factors. Advances in big data analytics and machine learning enable the detection of critical factors that effectively
impact quality and yield. This, combined with domain knowledge, enables rapid detection of root causes of failures. However,
there are some unique data science challenges in manufacturing.
(1) Unequal costs of false alarms and false negatives. When calculating accuracy, it must be recognized that false alarms
and false negatives may have unequal costs. Suppose a false negative is a bad part/instance that was wrongly predicted to
be good. Additionally, assume that a false alarm is a good part that was incorrectly predicted as bad. Assuming further that
the parts produced are safety critical, incorrectly predicting that bad parts are good (false negatives) can put human lives
at risk. Therefore, false negatives can be much more costly than false alarms. This trade-off needs to be considered when
translating business goals into technical goals and candidate evaluation methods.
MVI46-MCM Modbus Master/Slave Network Interface Module
REF543KM127AAAA ABB Feeder terminal REF 543
GHG122 COOPER Terminal Module
PHC21A-A022M1-E21A-00/S11 field inverter controller
PCD235A101 3BHE032025R0101 AC 800PEC control system
3500/64M 140734-05 Bently Nevada Dynamic Monitor
PCD230A101 3BHE022291R0101 AC 800PEC control system
MINI-UTDE 10 BASE-T Twisted pair Ethernet terminal
TPMC866-11 TEWS 8 Channel Serial Interface
DS2020FEXAG4 GE VME Control Board
IS215UCVHM06A IS415UCVHH1A B VME Control Board
IC697ALG440 GE current expander module
IC697ALG230 GE base converter module
IC697ACC720 GE Auxiliary Smart Battery Module
IC693MDL646 GE positive / negative logic input module
IC693MDL640 GE 24 Volt DC positive logic input module
IC693CPU341 GE single-slot CPU module
IC693CPU331 GE Series 90-30 component
IC670MDL930K GE relay output module
IC670MDL740J GE positive logic discrete output module
IC670MDL930J GE relay output module
IC693CMM321 GE Ethernet interface module
IC670PBI001 GE Profibus interface unit
IC693APU300K GE High-Speed Counter (HSC) module
IC670MDL740 GE positive logic discrete output module
IC670MDL930 GE relay output module
IC670MDL240K GE Sixteen channel discrete input module
IC670MDL640 GE Discrete Input Module
IC670MDL241J GE discrete input module
IC670MDL644 24 Volts DC Positive/Negative Input Module GE
IC670MDL730 GE DC Output Module
IC670MDL240J GE Sixteen (16) channel discrete input module
IC670CPU350 series 90-30 controller GE
IC670CHS101 I/O terminal block GE
IC670CHS002 I/O terminal block GE
IC660TSA100 GE Terminal assembly
IC660ELD100A GE IC660 CBD100 I/O Block
IC660ELB912G GE µGENI Network Interface Board
IC660EBD020 electronics assembly GE
IC200GBI001 VersaMax communication module GE
IC660BBD025 GE Block I/O from the Genius I/O Block series
IC200CHS001 Barrier-Style I/O Carrier manufactured GE
1756-L62 Allen-Bradley ControlLogix controller
1746-IA16 Allen-Bradley SLC 500 Digital AC Input Module
IC695CRU320-EL 1 GHz CPU from the GE Fanuc RX3i PACSytems
330878-90-00 Bently Nevada Proximitor Sensor
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