Description
hardware flow control. It is an ideal choice in the field of industrial automation.
(5) Perform predictive maintenance, analyze machine operating conditions, determine the main
causes of failures, and predict component failures to avoid unplanned downtime.
Traditional quality improvement programs include Six Sigma, Deming Cycle, Total Quality Management (TQM), and Dorian Scheinin’s
Statistical Engineering (SE) [6]. Methods developed in the 1980s and 1990s are typically applied to small amounts
of data and find univariate relationships between participating factors. The use of the MapReduce paradigm to simplify data processing in
large data sets and its further development have led to the mainstream proliferation of big data analytics [7]. Along with the development of
machine learning technology, the development of big data analytics has provided a series of new tools that can be applied to manufacturing
analysis. These capabilities include the ability to analyze gigabytes of data in batch and streaming modes, the ability to find complex multivariate
nonlinear relationships among many variables, and machine learning algorithms that separate causation from correlation.
Millions of parts are produced on production lines, and data on thousands of process and quality measurements are collected for them, which is
important for improving quality and reducing costs. Design of experiments (DoE), which repeatedly explores thousands of causes through
controlled experiments, is often too time-consuming and costly. Manufacturing experts rely on their domain knowledge to detect key
factors that may affect quality and then run
DoEs based on these factors. Advances in big data analytics and machine learning enable the detection of critical factors that effectively
impact quality and yield. This, combined with domain knowledge, enables rapid detection of root causes of failures. However,
there are some unique data science challenges in manufacturing.
(1) Unequal costs of false alarms and false negatives. When calculating accuracy, it must be recognized that false alarms
and false negatives may have unequal costs. Suppose a false negative is a bad part/instance that was wrongly predicted to
be good. Additionally, assume that a false alarm is a good part that was incorrectly predicted as bad. Assuming further that
the parts produced are safety critical, incorrectly predicting that bad parts are good (false negatives) can put human lives
at risk. Therefore, false negatives can be much more costly than false alarms. This trade-off needs to be considered when
translating business goals into technical goals and candidate evaluation methods.
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IS220PDIOH1B I/O communication modules
IS220PDIOH1A Communication card
IS220PDIIH1B Control card piece
IS220PDIIH1A Single-mode optical fiber module
IS220PDIAH1B /O module
IS221YDOAS1A Thermal resistance input module
IS220YDOAS1A Communication card piece
IS220YDIAS1A Communication interface module
IS221YAICS1A Positioning module
IS220YAICS1A Switch power supply
IS220YVIBS1A I/O terminal board
IS220PVIBH1A 8 channel digital input
IS220PAICH1A nalog output module
IS220PAICH2A 8 channel digital input
IS220PAOCH1A GE Analog output module
IS220PDIAH1A Discrete input module
IS220PDIAH1B Input module
IS220PDIIH1B Interface module
IS220PDOAH1A Controller master unit
IS220PPDAH1B System spare parts Function Description
IS220PPRFH1A features Drive unit
IS220PPRFH1B Diagnosis System board card
IS220PRTDH1A Processor board operation
IS220PPROS1B Input control panel
IS220PRTDH1BC Pulse amplifying panel IS220PRTDH1A
IS220PSVOH1B Redundant controller
IS220UCSAH1A PLC control system
IS220YDIAS1A Servo drive module
DS200UDSAG1ADE Analog input module
DS200TCTGG1AFF Analog output circuit board
DS200TCRAG1ACC Network communication card
DS200TCQCG1BKG Robot axis calculation board
DS200TCQCG1BGF Servo servo module
DS200TCQAG1BHF DCS card module
DS200TCPDG2BEC Serial port measuring board
DS200TCPDG1BEC Communication board
DS200TCEBG1ACE Digital output board
DS200TCPDG2BEC Analog quantity module
DS200TCPDG1BEC Pulse input submodule
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