Description
hardware flow control. It is an ideal choice in the field of industrial automation.
(5) Perform predictive maintenance, analyze machine operating conditions, determine the main
causes of failures, and predict component failures to avoid unplanned downtime.
Traditional quality improvement programs include Six Sigma, Deming Cycle, Total Quality Management (TQM), and Dorian Scheinin’s
Statistical Engineering (SE) [6]. Methods developed in the 1980s and 1990s are typically applied to small amounts
of data and find univariate relationships between participating factors. The use of the MapReduce paradigm to simplify data processing in
large data sets and its further development have led to the mainstream proliferation of big data analytics [7]. Along with the development of
machine learning technology, the development of big data analytics has provided a series of new tools that can be applied to manufacturing
analysis. These capabilities include the ability to analyze gigabytes of data in batch and streaming modes, the ability to find complex multivariate
nonlinear relationships among many variables, and machine learning algorithms that separate causation from correlation.
Millions of parts are produced on production lines, and data on thousands of process and quality measurements are collected for them, which is
important for improving quality and reducing costs. Design of experiments (DoE), which repeatedly explores thousands of causes through
controlled experiments, is often too time-consuming and costly. Manufacturing experts rely on their domain knowledge to detect key
factors that may affect quality and then run
DoEs based on these factors. Advances in big data analytics and machine learning enable the detection of critical factors that effectively
impact quality and yield. This, combined with domain knowledge, enables rapid detection of root causes of failures. However,
there are some unique data science challenges in manufacturing.
(1) Unequal costs of false alarms and false negatives. When calculating accuracy, it must be recognized that false alarms
and false negatives may have unequal costs. Suppose a false negative is a bad part/instance that was wrongly predicted to
be good. Additionally, assume that a false alarm is a good part that was incorrectly predicted as bad. Assuming further that
the parts produced are safety critical, incorrectly predicting that bad parts are good (false negatives) can put human lives
at risk. Therefore, false negatives can be much more costly than false alarms. This trade-off needs to be considered when
translating business goals into technical goals and candidate evaluation methods.
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GE I/O TC2000 Analog Board DS200TCCAG1BAA
DS200TCEAG1ACB GE
DS215TCEAG1BZZ01A GE
DS200TCEAG1BNE GE
DS200TCEBG1ACE GE
DS200TCPDG1BEC GE
DS200TCPDG2BEC GE
DS200TCQAG1BHF GE
DS200TCQCG1BGF GE
DS200TCQCG1BKG GE
DS200TCRAG1ACC GE
DS200TCTGG1AFF GE
DS200UDSAG1ADE GE
GFD563A101 3BHE046836R010 ABB
1TGE120010R1300 Industrial module ABB
1TGE120010R1001 Industrial module ABB
PDD24 central processor module ABB
PCD2000 Excitation control module ABB
8R37-2021-21-3101 Excitation control module
8R37-2021-21-3101 PCD2000 ABB
PCD232A 3BHE022293R0101
ABB 3BHE022293R0101
PCD232A Excitation control module
ABB PCD235A101
ABB 3BHE032025R0101
3BHE032025R0101 PCD235A101
3BHE023584R2365 Central Processing Unit
PPD113B03 Central Processing Unit
PPD113B03 3BHE023584R2365
PPD517A3011 3BHE051476R3011
3BHE051476R3011 Central Processing Unit
PPD517A3011 Central Processing Unit
PPD115A102 Central Processing Unit
3BHE017628R0102 Central Processing Unit
3BHE017628R0102 PPD115A102
PPD512A10-15000 3BHE040375R1023
3BHE040375R1023 Central Processing Unit
PPD512A10-15000 Central Processing Unit
PPD512 Central Processing Unit
3BHE023584R2365 Central Processing Unit
PPD113B03 Central Processing Unit
PPD113B03 3BHE023584R2365
PPD113B01-10-150000 3BHE023784R1023
3BHE023784R1023 Central Processing Unit
PPD113B01-10-150000 Central Processing Unit
3BHE023584R2634Central Processing Unit
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